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首页 > 商务会议 > 学术会议会议 > 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC2021) 更新时间:2019-09-06T14:56:32

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC2021)
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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC2021) 已截止报名

会议时间: 2021-07-19 09:00至 2021-07-23 18:00结束

会议地点: 安大略省  详细地址会前通知  None 周边酒店预订

主办单位: IEEE

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        会议内容


        会议简介

        You are cordially invited to attend the 2019 IEEE Nuclear and Space Radiation Effects Conference to be held July 8-12, 2019 at the Marriott Rivercenter Hotel, in San Antonio, Texas. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short course on a radiation effects issue with current relevance offered on July 8, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

        征稿信息 立即投稿
        重要日期

        初稿截稿日期:2021-02-05

        征稿简介

        Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

        征稿主题

        Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

        • Single-Event Charge Collection Phenomena and Mechanisms
        • Radiation Transport, Energy Deposition and Dosimetry
        • Ionizing Radiation Effects
        • Materials and Device Effects
        • Displacement Damage
        • Processing-Induced Radiation Effects

        Radiation Effects on Electronic and Photonic Devices,Circuits and Systems

        • Single Event Effects
        • MOS, Bipolar and Advanced Technologies
        • Systems on Chip, GPUs, FPGAs, Microprocessors
        • Isolation Technologies, such as SOI and SOS
        • Methods for Hardened Design and Manufacturing
        • Modeling of Devices, Circuits and Systems
        • Cryogenic or High Temperature Effects
        • Novel Device Structures, such as MEMs and Nanotechnologies
        • Techniques for Hardening Circuits and Systems

        Space, Atmospheric, and Terrestrial Radiation Effects

        • Characterization and Modeling of Radiation Environments
        • Space Weather Events and Effects
        • Spacecraft Charging
        • Predicting and Verifying Soft Error Rates (SER)

        Hardness Assurance Technology and Testing

        • New Testing Techniques, Guidelines and Hardness Assurance Methodology
        • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
        • Dosimetry

        New Developments of Interest to the Radiation Effects Community

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        主办方:IEEE

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