首届国际可靠性系统工程大会&2015故障预测与健康管理技术会议（2015 ICRSE & PHM-Beijing）将于2015年10月21日—23日在中国北京举行。

可靠性系统工程大会&2015故障预测与健康管理技术会议（2015 ICRSE & PHM-Beijing）

届时，相关学术专家和技术管理团体齐聚一堂，分享RSE&PHM在研究和应用领域的发展情况（包括航空航天、能源与动力系统、制造业、计算机与通讯、工业自动化等

等）。同时，大会营造良好的专业氛围，帮助各位参会者形成和谐互助的合作关系。

Conferences Program

Oct. 21, 2015 

Registration and Tutorials

Oct. 22, 2015 

Keynote Speeches
    Prof. Zili Wang, School of Reliability and Systems Engineering, Beihang University, China

Risk and Reliability are Part of Our Life
    Prof. Way Kuo, City University of Hong Kong, Hong Kong

Understanding and Predicting Electronics System Reliability
    Prof. Michael Pecht, CALCE, University of Maryland, USA

Prognostics and Health Management in the Landscape of BIG Data
    Prof. Christian Hansen, IEEE Reliability Society; School of Computing and Engineering Sciences, Eastern Washington University USA

Program Debugging with Effective Software Fault Localization
    Prof. Eric Wong, University of Texas at Dallas, USA

Cascading Failures in Networks of Networks
    Prof. Shlomo Havlin, Bar Ilan University, Israel

Reliability of Next Generation Data Storage Systems 
    Dr. Jon G. Elerath, Reliability Consultant, Placerville, California, USA

Reliability Testing: Objectives, Designs and Reliability Prediction
    Prof. Elsayed A. Elsayed, Industrial and Systems Engineering, Rutgers University, USA

New Advancements of Data Fusion Research on Prognostics
    Prof. Jianjun (Jan) Shi, H. Milton Stewart School of Industrial and Systems Engineering, Georgia Institute of Technology, USA

Dynamic Visual Cryptography for Fault Identification in Vibrating Micromechanical Structures 
    Prof. Minvydas Ragulskis, Research Group for Mathematical and Numerical Analysis of Dynamical Systems, Kaunas University of Technology, Lithuania

    Prof. D. N. P. Murthy, University of Queensland, Australia

Optimum Allocation Rule for Accelerated Degradation Tests (with a Class of Exponential-Dispersion Degradation Models)
    Prof. Sheng-Tsaing Tseng, Institute of Statistics, National Tsing-Hua University, Hsinchu, Taiwan

Safety of Systems of Systems: Challenges and Approaches
    Prof. John A McDermid, OBE, FREng, University of York UK

Oct. 23, 2015 

Keynote Speeches (In Sessions)
Challenges to Reliability Practices in the Medical Device Industry 
    Dr. Bo Song, Drager, Andover, Massachusetts, USA

Understanding the Challenges of the Exploration & Production Industry 
    Dr. Sheng Zhan, Sinopec, Houston, Texas, USA

Redefining Electronic Product Qualification with PHM 
    Dr. Preeti S Chauhan, Intel Corporation, Chandler, AZ, USA

Life Test Planning for Improved Reliability Prediction under Limited Time-to-Failure Data 
    Dr. Daeil Kwon, UNIST (Ulsan National Institute of Science and Technology), South Korea

Bayesian Methodology for System Reliability Assessment 
    Dr. Yan Liu, Medtronic, Inc., Fridley, MN, USA

Field Usage Life Prediction of Electronics 
    Dr. Fei Chai, Intel Corporation, Chandler, AZ, USA

An Integrated Data-driven Prognostics Approach: from Critical Components Identification to Remaining Useful life Prediction
    Dr. Kamal Medjaher and Prof. Noureddine Zerhouni, FEMTO-ST Institute /National Institute in Mechanics and Microtechnologies, Besan?on, France

......(Pending)

Education Forum 
Education on RMTSSQ (Reliability, Maintainability, Testability, Supportability, Safety and Quality) 
    Chair: Prof. Shengkui Zeng, School of Reliability and Systems Engineering, Beihang University, China
......

Closing Banquet